A Modified Version of the Waxman Algorithm

The iterative algorithm recently proposed by Waxman for solving eigenvalue problems, which relies on the method of moments, has been modified to improve its convergence considerably without sacrificing its benefits or elegance. The suggested modification is based on methods to calculate low-lying eigenpairs of large bounded hermitian operators or matrices

Hard exclusive photoproduction of Φ\Phi and J/ΨJ/\Psi mesons

We present predictions for differential cross sections for the reaction $\gamma p \to \Phi p$ and give an outlook to which extent our calculations may be generalized to the photoproduction of $J/\Psi$ mesons. Our results are obtained within perturbative QCD treating the proton as a quark-diquark system.Comment: 4 pages, 1 figure, uses Elsevier style espcrc1.st

Exclusive Decuplet-Baryon Pair Production in Two-Photon Collisions

This work extends our previous studies of two-photon annihilation into baryon-antibaryon pairs from spin-1/2 octet to spin-3/2 decuplet baryons. Our approach is based on perturbative QCD and treats baryons as quark-diquark systems. Using the same model parameters as in our previous work, supplemented by QCD sum-rule results for decuplet baryon wave functions, we are able to give absolute predictions for decuplet baryon cross sections without introducing new parameters. We find that the $\Delta^{++}$ cross section is of the same order of magnitude as the proton cross section, well within experimental bounds.Comment: 14 pages, 2 figure

Small business credit scoring and credit availability

U.S. commercial banks are increasingly using credit scoring models to underwrite small business credits. This paper discusses this technology, evaluates the research findings on the effects of this technology on small business credit availability, and links these findings to a number of research and public policy issues.

Study of infrared evaluation in qualification and failure analysis of semiconductor devices Final report, 28 Jun. 1967 - 10 Jun. 1969

Techniques for providing infrared data for use in failure analysis of semiconductor device